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Characterization and simulation methodology for time-dependent variability in advanced technologies

dc.contributor.authorWeckx, Pieter
dc.contributor.authorKaczer, Ben
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorFranco, Jacopo
dc.contributor.authorSimicic, Marko
dc.contributor.authorRoussel, Philippe
dc.contributor.authorLinten, Dimitri
dc.contributor.authorThean, Aaron
dc.contributor.authorVerkest, Diederik
dc.contributor.authorCatthoor, Francky
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-23T00:57:33Z
dc.date.available2021-10-23T00:57:33Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26170
dc.sourceIIOimport
dc.titleCharacterization and simulation methodology for time-dependent variability in advanced technologies
dc.typeProceedings paper
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorThean, Aaron
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage8
dc.source.conferenceIEEE Custom Integrated Circuits Conference - CICC
dc.source.conferencedate28/09/2015
dc.source.conferencelocationSan Jose, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7338379
imec.availabilityPublished - open access


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