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Impact of time-dependent variability on the yield and performance of 6T SRAM cells in an advanced HK/MG technology

dc.contributor.authorWeckx, Pieter
dc.contributor.authorKaczer, Ben
dc.contributor.authorRoussel, Philippe
dc.contributor.authorCatthoor, Francky
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-23T00:58:03Z
dc.date.available2021-10-23T00:58:03Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26171
dc.sourceIIOimport
dc.titleImpact of time-dependent variability on the yield and performance of 6T SRAM cells in an advanced HK/MG technology
dc.typeProceedings paper
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage4
dc.source.conferenceInternational Conference on IC Design and Technology - ICICDT
dc.source.conferencedate1/06/2015
dc.source.conferencelocationLeuven Belgium
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7165896
imec.availabilityPublished - open access


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