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Optical characterisation of silicon wafers with and without a back surface reflector

dc.contributor.authorHanselaer, P.
dc.contributor.authorVan den Abeele, A.
dc.contributor.authorForment, S.
dc.contributor.authorFrisson, Louis
dc.contributor.authorPoortmans, Jef
dc.date.accessioned2021-09-30T12:07:52Z
dc.date.available2021-09-30T12:07:52Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2618
dc.sourceIIOimport
dc.titleOptical characterisation of silicon wafers with and without a back surface reflector
dc.typeProceedings paper
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1302
dc.source.endpage1305
dc.source.conference2nd World Conference and Exhibition on Photovoltaic Solar Energy Conversion
dc.source.conferencedate6/07/1998
dc.source.conferencelocationVienna Austria
imec.availabilityPublished - open access


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