Authors

Wu, Qian; Porti, Marc; Bayerl, Albin; Martin-Martinez, Javier; Rodriguez, Rosana; Nafria, Montserrat; Aymerich, Xavier; Simoen, Eddy

ISSN

1071-1023

Issue

2

Journal

Journal of Vacuum Science and Technology B

Volume

33

Title

Channel-hot-carrier degradation of strained MOSFETs: a device level and nanoscale combined approach

Publication type

Journal article

Embargo date

9999-12-31