dc.contributor.author | Xu, Blair | |
dc.contributor.author | Hantschel, Thomas | |
dc.contributor.author | Tsigkourakos, Menelaos | |
dc.contributor.author | Vandervorst, Wilfried | |
dc.date.accessioned | 2021-10-23T01:16:28Z | |
dc.date.available | 2021-10-23T01:16:28Z | |
dc.date.issued | 2015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26206 | |
dc.source | IIOimport | |
dc.title | Scanning spreading resistance microscopy for electrical characterization of diamond interfacial layers | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Hantschel, Thomas | |
dc.contributor.imecauthor | Vandervorst, Wilfried | |
dc.contributor.orcidimec | Hantschel, Thomas::0000-0001-9476-4084 | |
dc.source.peerreview | no | |
dc.source.conference | SBDD XX Hasselt Diamond Workshop | |
dc.source.conferencedate | 25/02/2015 | |
dc.source.conferencelocation | Hasselt Belgium | |
imec.availability | Published - imec | |