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Scanning spreading resistance microscopy for electrical characterization of diamond interfacial layers

dc.contributor.authorXu, Blair
dc.contributor.authorHantschel, Thomas
dc.contributor.authorTsigkourakos, Menelaos
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-23T01:16:28Z
dc.date.available2021-10-23T01:16:28Z
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26206
dc.sourceIIOimport
dc.titleScanning spreading resistance microscopy for electrical characterization of diamond interfacial layers
dc.typeOral presentation
dc.contributor.imecauthorHantschel, Thomas
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecHantschel, Thomas::0000-0001-9476-4084
dc.source.peerreviewno
dc.source.conferenceSBDD XX Hasselt Diamond Workshop
dc.source.conferencedate25/02/2015
dc.source.conferencelocationHasselt Belgium
imec.availabilityPublished - imec


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