Show simple item record

Read path degradation analysis in SRAM

dc.contributor.authorAgbo, Innocent
dc.contributor.authorTaouil, Mottaqiallah
dc.contributor.authorHamdioui, Said
dc.contributor.authorWeckx, Pieter
dc.contributor.authorCosemans, Stefan
dc.contributor.authorCatthoor, Francky
dc.contributor.authorDehaene, Wim
dc.date.accessioned2021-10-23T10:04:18Z
dc.date.available2021-10-23T10:04:18Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26273
dc.sourceIIOimport
dc.titleRead path degradation analysis in SRAM
dc.typeProceedings paper
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorDehaene, Wim
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage2
dc.source.conference21th IEEE European Test Symposium - ETS
dc.source.conferencedate23/05/2016
dc.source.conferencelocationAmsterdam The Netherlands
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7519325/
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
35047.pdf
Size:
277.6Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record