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Compressed sensing mm-wave SAR for non-destructive testing applications using side information

dc.contributor.authorBecquaert, Mathias
dc.contributor.authorCristofani, Edison
dc.contributor.authorPandey, Gokarna
dc.contributor.authorVandewal, Marijke
dc.contributor.authorStiens, Johan
dc.contributor.authorDeligiannis, Nikos
dc.date.accessioned2021-10-23T10:06:21Z
dc.date.available2021-10-23T10:06:21Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26327
dc.sourceIIOimport
dc.titleCompressed sensing mm-wave SAR for non-destructive testing applications using side information
dc.typeMeeting abstract
dc.contributor.imecauthorStiens, Johan
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage6
dc.source.conferenceIEEE Radar Conference
dc.source.conferencedate2/05/2016
dc.source.conferencelocationPhiladelphia, PA USA
dc.identifier.url10.1109/RADAR.2016.7485244
imec.availabilityPublished - imec


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