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Low-frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETs
Publication:
Low-frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETs
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Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Boudier, Dimitri
;
Cretu, Bogdan
;
Simoen, Eddy
;
Veloso, Anabela
;
Collaert, Nadine
;
Thean, Aaron
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1965
since deposited on 2021-10-23
2
last month
Acq. date: 2025-12-10
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Metrics
Views
1965
since deposited on 2021-10-23
2
last month
Acq. date: 2025-12-10
Citations