Authors

Celano, Umberto; Hou, Yi; Goux, Ludovic; Fantini, Andrea; Degraeve, Robin; Richard, Olivier; Bender, Hugo; Jurczak, Gosia; Vandervorst, Wilfried

Conference

MRS Spring Meeting Symposium EP11: Novel Materials for End-of-Roadmap Devices in Logic, Power and Memory

Title

Tomographic filament observation and scaling projection of RRAM in 3 x 3 nm dimensions

Publication type

Meeting abstract