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Scalpel SPM: a slice-and-view approach for tomography based on scanning probe microscopy

dc.contributor.authorCelano, Umberto
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-23T10:13:36Z
dc.date.available2021-10-23T10:13:36Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26410
dc.sourceIIOimport
dc.titleScalpel SPM: a slice-and-view approach for tomography based on scanning probe microscopy
dc.typeMeeting abstract
dc.contributor.imecauthorCelano, Umberto
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecCelano, Umberto::0000-0002-2856-3847
dc.source.peerreviewno
dc.source.beginpageCM2.2.08
dc.source.conferenceMRS spring meeting CM2: Quantitative Toomography for Materials Research
dc.source.conferencedate28/03/2016
dc.source.conferencelocationPhoenix, AZ USA
dc.identifier.urlhttps://mrsspring.zerista.com/event/member/241818
imec.availabilityPublished - imec


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