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Soft breakdown in ultrathin gate oxides: correlation with the percolation theory of nonlinear conductors
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Soft breakdown in ultrathin gate oxides: correlation with the percolation theory of nonlinear conductors
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Date
1998
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Houssa, Michel
;
Nigam, Tanya
;
Mertens, Paul
;
Heyns, Marc
Journal
Applied Physics Letters
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1882
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Acq. date: 2025-12-16
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Metrics
Views
1882
since deposited on 2021-09-30
1
last month
Acq. date: 2025-12-16
Citations