Show simple item record

ESD diodes in Bulk Si gate-all-around vertically stacked horizontal nanowire technology

dc.contributor.authorChen, Shih-Hung
dc.contributor.authorHellings, Geert
dc.contributor.authorScholz, Mirko
dc.contributor.authorLinten, Dimitri
dc.contributor.authorMertens, Hans
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorBoschke, Roman
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorHoriguchi, Naoto
dc.date.accessioned2021-10-23T10:16:24Z
dc.date.available2021-10-23T10:16:24Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26433
dc.sourceIIOimport
dc.titleESD diodes in Bulk Si gate-all-around vertically stacked horizontal nanowire technology
dc.typeProceedings paper
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorMertens, Hans
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorHoriguchi, Naoto
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecHoriguchi, Naoto::0000-0001-5490-0416
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage890
dc.source.endpage893
dc.source.conferenceIEEE International Electron Devices Meeting - IEDM
dc.source.conferencedate3/12/2016
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
34388.pdf
Size:
586.4Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record