dc.contributor.author | Chen, Shih-Hung | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Scholz, Mirko | |
dc.contributor.author | Hellings, Geert | |
dc.contributor.author | Boschke, Roman | |
dc.contributor.author | Horiguchi, Naoto | |
dc.date.accessioned | 2021-10-23T10:16:46Z | |
dc.date.available | 2021-10-23T10:16:46Z | |
dc.date.issued | 2016 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26436 | |
dc.source | IIOimport | |
dc.title | ESD Challenges in sub-10nm CMOS technologies | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Chen, Shih-Hung | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Hellings, Geert | |
dc.contributor.imecauthor | Horiguchi, Naoto | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
dc.contributor.orcidimec | Horiguchi, Naoto::0000-0001-5490-0416 | |
dc.source.peerreview | yes | |
dc.source.conference | Taiwan ESD and Reliability Conference | |
dc.source.conferencedate | 31/10/2016 | |
dc.source.conferencelocation | Hsinchu Taiwan | |
imec.availability | Published - imec | |