Impact of wire geometry on interconnect RC and circuit delay

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Authors

Ciofi, Ivan; Contino, Antonino; Roussel, Philippe; Baert, Rogier; Vega Gonzalez, Victor; Croes, Kristof; Badaroglu, Mustafa; Wilson, Chris; Raghavan, Praveen; Mercha, Abdelkarim; Verkest, Diederik; Groeseneken, Guido; Mocuta, Dan; Thean, Aaron

ISSN

0018-9383

Issue

6

Journal

IEEE Transactions on Electron Devices

Volume

63

Title

Impact of wire geometry on interconnect RC and circuit delay

Publication type

Journal article

Embargo date

9999-12-31

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