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Impact of wire geometry on interconnect RC and circuit delay

dc.contributor.authorCiofi, Ivan
dc.contributor.authorContino, Antonino
dc.contributor.authorRoussel, Philippe
dc.contributor.authorBaert, Rogier
dc.contributor.authorVega Gonzalez, Victor
dc.contributor.authorCroes, Kristof
dc.contributor.authorBadaroglu, Mustafa
dc.contributor.authorWilson, Chris
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorVerkest, Diederik
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMocuta, Dan
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-23T10:18:58Z
dc.date.available2021-10-23T10:18:58Z
dc.date.issued2016
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26452
dc.sourceIIOimport
dc.titleImpact of wire geometry on interconnect RC and circuit delay
dc.typeJournal article
dc.contributor.imecauthorCiofi, Ivan
dc.contributor.imecauthorContino, Antonino
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorBaert, Rogier
dc.contributor.imecauthorVega Gonzalez, Victor
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorBadaroglu, Mustafa
dc.contributor.imecauthorWilson, Chris
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecCiofi, Ivan::0000-0003-1374-4116
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage2488
dc.source.endpage2496
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue6
dc.source.volume63
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7473986
imec.availabilityPublished - open access


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