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Atomic disorder as an intrinsic source of variability in filamentary RRAM devices – ab initio investigations
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Authors
Clima, Sergiu
;
Fantini, Andrea
;
Goux, Ludovic
;
Govoreanu, Bogdan
;
Jurczak, Gosia
;
Pourtois, Geoffrey
Conference
AVS 63rd International Symposium & Exhibition
Title
Atomic disorder as an intrinsic source of variability in filamentary RRAM devices – ab initio investigations
Publication type
Meeting abstract
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