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Conference contributions
Atomic disorder as an intrinsic source of variability in filamentary RRAM devices – ab initio investigations
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Atomic disorder as an intrinsic source of variability in filamentary RRAM devices – ab initio investigations
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Date
2016
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Clima, Sergiu
;
Fantini, Andrea
;
Goux, Ludovic
;
Govoreanu, Bogdan
;
Jurczak, Gosia
;
Pourtois, Geoffrey
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1977
since deposited on 2021-10-23
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Acq. date: 2026-03-17
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Views
1977
since deposited on 2021-10-23
1
last month
Acq. date: 2026-03-17
Citations