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Conference contributions
Interface passivation of III-V/high-k materials by High Energy X-ray Photoelectron Spectroscopy: A quantitative evaluation
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Interface passivation of III-V/high-k materials by High Energy X-ray Photoelectron Spectroscopy: A quantitative evaluation
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Date
2016
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Conard, Thierry
;
Spampinato, Valentina
;
Nyns, Laura
;
Sioncke, Sonja
;
Ablett, James
;
Vandervorst, Wilfried
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1957
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Acq. date: 2026-01-11
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Views
1957
since deposited on 2021-10-23
2
last month
Acq. date: 2026-01-11
Citations