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Test-station for flexible semi-automatic wafer-level silicon photonics testing

dc.contributor.authorDe Coster, Jeroen
dc.contributor.authorDe Heyn, Peter
dc.contributor.authorPantouvaki, Marianna
dc.contributor.authorSnyder, Brad
dc.contributor.authorChen, Hongtao
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorAbsil, Philippe
dc.contributor.authorVan Campenhout, Joris
dc.contributor.authorBolt, Bryan
dc.date.accessioned2021-10-23T10:24:57Z
dc.date.available2021-10-23T10:24:57Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26492
dc.sourceIIOimport
dc.titleTest-station for flexible semi-automatic wafer-level silicon photonics testing
dc.typeProceedings paper
dc.contributor.imecauthorDe Coster, Jeroen
dc.contributor.imecauthorDe Heyn, Peter
dc.contributor.imecauthorPantouvaki, Marianna
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.imecauthorAbsil, Philippe
dc.contributor.imecauthorVan Campenhout, Joris
dc.contributor.orcidimecDe Heyn, Peter::0000-0003-3523-7377
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.contributor.orcidimecVan Campenhout, Joris::0000-0003-0778-2669
dc.source.peerreviewyes
dc.source.beginpage1
dc.source.endpage6
dc.source.conference21th IEEE European Test Symposium - ETS
dc.source.conferencedate24/05/2016
dc.source.conferencelocationAmsterdam Netherlands
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7519306
imec.availabilityPublished - imec


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