Show simple item record

Dislocations in GaN/sapphire films: their distribution and effect on stress and optical properties

dc.contributor.authorJain, Suresh
dc.contributor.authorPinardi, Kuntjoro
dc.contributor.authorMaes, Herman
dc.contributor.authorVan Overstraeten, Roger
dc.contributor.authorWillander, M.
dc.contributor.authorAtkinson, A.
dc.date.accessioned2021-09-30T12:16:08Z
dc.date.available2021-09-30T12:16:08Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2650
dc.sourceIIOimport
dc.titleDislocations in GaN/sapphire films: their distribution and effect on stress and optical properties
dc.typeProceedings paper
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage875
dc.source.endpage880
dc.source.conferenceNitride Semiconductors
dc.source.conferencedate1/12/1997
dc.source.conferencelocationBoston, MA USA
imec.availabilityPublished - open access
imec.internalnotesMRS Symposium Proceedings; Vol. 482


Files in this item

Thumbnail
Name:
2371.pdf
Size:
321.7Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record