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Quantitative model for post-program instabilities in filamentary RRAM

dc.contributor.authorDegraeve, Robin
dc.contributor.authorFantini, Andrea
dc.contributor.authorGorine, G.
dc.contributor.authorRoussel, Philippe
dc.contributor.authorClima, Sergiu
dc.contributor.authorChen, Michael
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorGoux, Ludovic
dc.contributor.authorLinten, Dimitri
dc.contributor.authorJurczak, Gosia
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-23T10:30:57Z
dc.date.available2021-10-23T10:30:57Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26527
dc.sourceIIOimport
dc.titleQuantitative model for post-program instabilities in filamentary RRAM
dc.typeProceedings paper
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorFantini, Andrea
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage6C.1
dc.source.conferenceIEEE Reliability Physics Symposium - IRPS
dc.source.conferencedate17/04/2016
dc.source.conferencelocationPasadena, CA USA
dc.identifier.urlRRAM http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=7574567
imec.availabilityPublished - open access


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