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Influence of elemental incorporation of Ti, Si and N on thermal stability of GeTe6 ovonic threshold switching material for selector applications

dc.contributor.authorDumortier, J.
dc.contributor.authorOpsomer, Karl
dc.contributor.authorVelea, Alin
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorJurczak, Gosia
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorDetavernier, Christoph
dc.date.accessioned2021-10-23T10:42:33Z
dc.date.available2021-10-23T10:42:33Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26587
dc.sourceIIOimport
dc.titleInfluence of elemental incorporation of Ti, Si and N on thermal stability of GeTe6 ovonic threshold switching material for selector applications
dc.typeMeeting abstract
dc.contributor.imecauthorOpsomer, Karl
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage123
dc.source.endpage124
dc.source.conferenceMaterials for Advanced Metallization (MAM) 2016
dc.source.conferencedate20/03/2016
dc.source.conferencelocationBrussels Belgium
imec.availabilityPublished - open access
imec.internalnotespaper PMM-03


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