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Band-to-band tunneling off-state leakage in Ge fins and nanowires: effect of quantum confinement

dc.contributor.authorEneman, Geert
dc.contributor.authorVerhulst, Anne
dc.contributor.authorSmith, Lee
dc.contributor.authorMoroz, Victor
dc.contributor.authorDe Keersgieter, An
dc.contributor.authorMocuta, Anda
dc.contributor.authorCollaert, Nadine
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-23T10:45:46Z
dc.date.available2021-10-23T10:45:46Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26602
dc.sourceIIOimport
dc.titleBand-to-band tunneling off-state leakage in Ge fins and nanowires: effect of quantum confinement
dc.typeProceedings paper
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorVerhulst, Anne
dc.contributor.imecauthorDe Keersgieter, An
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecVerhulst, Anne::0000-0002-3742-9017
dc.contributor.orcidimecDe Keersgieter, An::0000-0002-5527-8582
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage27
dc.source.endpage30
dc.source.conference21st International Conference on Simulation of Semiconductor Processes and Process - SISPAD
dc.source.conferencedate06/09/2016
dc.source.conferencelocationNürnberg Germany
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7605140
imec.availabilityPublished - imec


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