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Electric field direct force in electromigration mechanism

dc.contributor.authorKarpushin, A. A.
dc.contributor.authorSorokin, A. N.
dc.contributor.authorBaklanov, Mikhaïl
dc.contributor.authorMaex, Karen
dc.date.accessioned2021-09-30T12:18:35Z
dc.date.available2021-09-30T12:18:35Z
dc.date.issued1998
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/2660
dc.sourceIIOimport
dc.titleElectric field direct force in electromigration mechanism
dc.typeProceedings paper
dc.contributor.imecauthorMaex, Karen
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage195
dc.source.endpage198
dc.source.conferenceMaterials Reliability in Microelectronics VIII
dc.source.conferencedate13/04/1998
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - open access
imec.internalnotesMRS Symposium Proceedings; Vol. 516


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