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InAs/GaSb interface investigation by high resolution HAADF-STEM

dc.contributor.authorFavia, Paola
dc.contributor.authorRichard, Olivier
dc.contributor.authorEl Kazzi, Salim
dc.contributor.authorVan Marcke, Patricia
dc.contributor.authorBender, Hugo
dc.date.accessioned2021-10-23T10:47:44Z
dc.date.available2021-10-23T10:47:44Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26611
dc.sourceIIOimport
dc.titleInAs/GaSb interface investigation by high resolution HAADF-STEM
dc.typeMeeting abstract
dc.contributor.imecauthorFavia, Paola
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorVan Marcke, Patricia
dc.contributor.imecauthorBender, Hugo
dc.contributor.orcidimecFavia, Paola::0000-0002-1019-3497
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.source.peerreviewyes
dc.source.conference16th European Microscopy Congress
dc.source.conferencedate28/08/2016
dc.source.conferencelocationLyon France
dc.identifier.urlhttp://emc-proceedings.com/abstract/inasgasb-interface-investigation-by-high-resolution-haadf-stem/
imec.availabilityPublished - imec


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