dc.contributor.author | Franco, Jacopo | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Vais, Abhitosh | |
dc.contributor.author | Sioncke, Sonja | |
dc.contributor.author | Arimura, Hiroaki | |
dc.contributor.author | Putcha, Vamsi | |
dc.contributor.author | Alian, AliReza | |
dc.contributor.author | Waldron, Niamh | |
dc.contributor.author | Zhou, Daisy | |
dc.contributor.author | Nyns, Laura | |
dc.contributor.author | Mitard, Jerome | |
dc.contributor.author | Witters, Liesbeth | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Groeseneken, Guido | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Linten, Dimitri | |
dc.date.accessioned | 2021-10-23T10:52:36Z | |
dc.date.available | 2021-10-23T10:52:36Z | |
dc.date.issued | 2016 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26631 | |
dc.source | IIOimport | |
dc.title | Bias Temperature Instability (BTI) in high-mobility channel devices: SiGe, Ge, and InGaAs | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Franco, Jacopo | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Vais, Abhitosh | |
dc.contributor.imecauthor | Arimura, Hiroaki | |
dc.contributor.imecauthor | Putcha, Vamsi | |
dc.contributor.imecauthor | Alian, AliReza | |
dc.contributor.imecauthor | Waldron, Niamh | |
dc.contributor.imecauthor | Zhou, Daisy | |
dc.contributor.imecauthor | Nyns, Laura | |
dc.contributor.imecauthor | Mitard, Jerome | |
dc.contributor.imecauthor | Witters, Liesbeth | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Vais, Abhitosh::0000-0002-0317-7720 | |
dc.contributor.orcidimec | Putcha, Vamsi::0000-0003-1907-5486 | |
dc.contributor.orcidimec | Nyns, Laura::0000-0001-8220-870X | |
dc.contributor.orcidimec | Mitard, Jerome::0000-0002-7422-079X | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.source.peerreview | yes | |
dc.source.conference | Workshop on Dielectrics in Microelectronics - WoDiM | |
dc.source.conferencedate | 27/06/2016 | |
dc.source.conferencelocation | Catania Italy | |
imec.availability | Published - imec | |