Authors

Garcia Bardon, Marie; Sherazi, Yasser; Schuddinck, Pieter; Jang, Doyoung; Yakimets, Dmitry; Debacker, Peter; Baert, Rogier; Mertens, Hans; Badaroglu, Mustafa; Mocuta, Anda; Horiguchi, Naoto; Mocuta, Dan; Raghavan, Praveen; Ryckaert, Julien; Verkest, Diederik; Steegen, An

Conference

IEEE International Electron Devices Meeting - IEDM

Title

Extreme scaling enabled by 5 tracks cells : holistic design-device co-optimization for FinFETs and lateral nanowires

Publication type

Proceedings paper

Embargo date

9999-12-31