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BTI variability of SRAM cells under periodically changing stress profiles

dc.contributor.authorGiering, Kay-Uwe
dc.contributor.authorLange, Andre
dc.contributor.authorKaczer, Ben
dc.contributor.authorJancke, Roland
dc.date.accessioned2021-10-23T10:57:49Z
dc.date.available2021-10-23T10:57:49Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26652
dc.sourceIIOimport
dc.titleBTI variability of SRAM cells under periodically changing stress profiles
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewyes
dc.source.conferenceInternational Integrated Reliability Workshop - IIRW
dc.source.conferencedate9/10/2016
dc.source.conferencelocationFallen Leaf Lake, CA USA
imec.availabilityPublished - imec


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