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dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorDi Piazza, Luca
dc.contributor.authorMa, Jigang
dc.contributor.authorConard, Thierry
dc.contributor.authorVanleenhove, Anja
dc.contributor.authorBelmonte, Attilio
dc.contributor.authorRadisic, Dunja
dc.contributor.authorPopovici, Mihaela Ioana
dc.contributor.authorVelea, Alin
dc.contributor.authorRedolfi, Augusto
dc.contributor.authorRichard, Olivier
dc.contributor.authorClima, Sergiu
dc.contributor.authorAdelmann, Christoph
dc.contributor.authorBender, Hugo
dc.contributor.authorJurczak, Gosia
dc.date.accessioned2021-10-23T11:00:49Z
dc.date.available2021-10-23T11:00:49Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26664
dc.sourceIIOimport
dc.titleAdvanced a-VMCO resistive switching memory through inner interface engineering with wide (>10²) on/off window, tunable μA-range switching current and excellent variability
dc.typeProceedings paper
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorDi Piazza, Luca
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorVanleenhove, Anja
dc.contributor.imecauthorBelmonte, Attilio
dc.contributor.imecauthorRadisic, Dunja
dc.contributor.imecauthorPopovici, Mihaela Ioana
dc.contributor.imecauthorRedolfi, Augusto
dc.contributor.imecauthorRichard, Olivier
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorAdelmann, Christoph
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.contributor.orcidimecRichard, Olivier::0000-0002-3994-8021
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecAdelmann, Christoph::0000-0002-4831-3159
dc.contributor.orcidimecGovoreanu, Bogdan::0000-0001-7210-2979
dc.contributor.orcidimecPopovici, Mihaela Ioana::0000-0002-9838-1088
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage82
dc.source.endpage83
dc.source.conferenceIEEE Symposium on VLSI Technology
dc.source.conferencedate13/06/2016
dc.source.conferencelocationHonolulu, HI USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=7573387
imec.availabilityPublished - imec


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