dc.contributor.author | Huynh Bao, Trong | |
dc.contributor.author | Sakhare, Sushil | |
dc.contributor.author | Yakimets, Dmitry | |
dc.contributor.author | Ryckaert, Julien | |
dc.contributor.author | Thean, Aaron | |
dc.contributor.author | Mercha, Abdelkarim | |
dc.contributor.author | Verkest, Diederik | |
dc.contributor.author | Wambacq, Piet | |
dc.date.accessioned | 2021-10-23T11:26:39Z | |
dc.date.available | 2021-10-23T11:26:39Z | |
dc.date.issued | 2016 | |
dc.identifier.issn | 0018-9383 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26761 | |
dc.source | IIOimport | |
dc.title | A comprehensive benchmark and optimization of 5-nm lateral and vertical GAA 6T-SRAMs | |
dc.type | Journal article | |
dc.contributor.imecauthor | Yakimets, Dmitry | |
dc.contributor.imecauthor | Ryckaert, Julien | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.imecauthor | Mercha, Abdelkarim | |
dc.contributor.imecauthor | Verkest, Diederik | |
dc.contributor.imecauthor | Wambacq, Piet | |
dc.contributor.orcidimec | Mercha, Abdelkarim::0000-0002-2174-6958 | |
dc.contributor.orcidimec | Verkest, Diederik::0000-0001-6567-2746 | |
dc.contributor.orcidimec | Wambacq, Piet::0000-0003-4388-7257 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 643 | |
dc.source.endpage | 651 | |
dc.source.journal | IEEE Transactions on Electron Devices | |
dc.source.issue | 2 | |
dc.source.volume | 63 | |
dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7358115 | |
imec.availability | Published - open access | |