A comprehensive benchmark and optimization of 5-nm lateral and vertical GAA 6T-SRAMs

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Authors

Huynh Bao, Trong; Sakhare, Sushil; Yakimets, Dmitry; Ryckaert, Julien; Thean, Aaron; Mercha, Abdelkarim; Verkest, Diederik; Wambacq, Piet

ISSN

0018-9383

Issue

2

Journal

IEEE Transactions on Electron Devices

Volume

63

Title

A comprehensive benchmark and optimization of 5-nm lateral and vertical GAA 6T-SRAMs

Publication type

Journal article

Embargo date

9999-12-31

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