A comprehensive benchmark and optimization of 5-nm lateral and vertical GAA 6T-SRAMs

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Author(s)

Huynh Bao, Trong

;

Sakhare, Sushil

;

Yakimets, Dmitry

;

Ryckaert, Julien

;

;

Mercha, Abdelkarim

;

Verkest, Diederik

;

Journal

IEEE Transactions on Electron Devices

Metrics

1958 since deposited on 2021-10-23

1last month

Acq. date: 2025-12-08