dc.contributor.author | Kesters, Els | |
dc.contributor.author | Iwasaki, Akihisa | |
dc.contributor.author | Le, Quoc Toan | |
dc.contributor.author | Holsteyns, Frank | |
dc.date.accessioned | 2021-10-23T11:43:35Z | |
dc.date.available | 2021-10-23T11:43:35Z | |
dc.date.issued | 2016 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/26818 | |
dc.source | IIOimport | |
dc.title | Impact of dissolved oxygen in dilute HF solution on material etch | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Kesters, Els | |
dc.contributor.imecauthor | Le, Quoc Toan | |
dc.contributor.imecauthor | Holsteyns, Frank | |
dc.contributor.orcidimec | Le, Quoc Toan::0000-0002-0206-6279 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 251 | |
dc.source.endpage | 254 | |
dc.source.conference | Ultra Clean Processing of Semiconductor Surfaces XIII - UCPSS | |
dc.source.conferencedate | 11/09/2016 | |
dc.source.conferencelocation | Knokke-Heist Belgium | |
dc.identifier.url | http://www.scientific.net/SSP.255.251 | |
imec.availability | Published - imec | |
imec.internalnotes | Solid State Phenomena; Vol. 255 | |