The impact of process variation and stochastic aging in nanoscale VLSI

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Authors
Kiamehr, Saman; Weckx, Pieter; Tahoori, Mehdi; Kaczer, Ben; Kukner, Halil; Raghavan, Praveen; Groeseneken, Guido; Catthoor, Francky
Conference
International Reliability Physics Symposium - IRPS
Title
The impact of process variation and stochastic aging in nanoscale VLSI
Publication type
Proceedings paper
Embargo date
9999-12-31
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