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Switching characteristics of perpendicular magnetic tunnel junction with various sizes

dc.contributor.authorKim, Woojin
dc.contributor.authorRao, Siddharth
dc.contributor.authorVan Beek, Simon
dc.contributor.authorGarello, Kevin
dc.contributor.authorCouet, Sebastien
dc.contributor.authorSwerts, Johan
dc.contributor.authorMertens, Sofie
dc.contributor.authorLin, Tsann
dc.contributor.authorSouriau, Laurent
dc.contributor.authorKundu, Shreya
dc.contributor.authorTsvetanova, Diana
dc.contributor.authorCrotti, Davide
dc.contributor.authorDonadio, Gabriele Luca
dc.contributor.authorYasin, Farrukh
dc.contributor.authorSakhare, Sushil
dc.contributor.authorFurnemont, Arnaud
dc.contributor.authorKar, Gouri Sankar
dc.date.accessioned2021-10-23T11:49:26Z
dc.date.available2021-10-23T11:49:26Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26835
dc.sourceIIOimport
dc.titleSwitching characteristics of perpendicular magnetic tunnel junction with various sizes
dc.typeOral presentation
dc.contributor.imecauthorKim, Woojin
dc.contributor.imecauthorRao, Siddharth
dc.contributor.imecauthorVan Beek, Simon
dc.contributor.imecauthorGarello, Kevin
dc.contributor.imecauthorCouet, Sebastien
dc.contributor.imecauthorSwerts, Johan
dc.contributor.imecauthorMertens, Sofie
dc.contributor.imecauthorSouriau, Laurent
dc.contributor.imecauthorKundu, Shreya
dc.contributor.imecauthorTsvetanova, Diana
dc.contributor.imecauthorCrotti, Davide
dc.contributor.imecauthorDonadio, Gabriele Luca
dc.contributor.imecauthorYasin, Farrukh
dc.contributor.imecauthorFurnemont, Arnaud
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.orcidimecRao, Siddharth::0000-0001-6161-3052
dc.contributor.orcidimecVan Beek, Simon::0000-0002-2499-4172
dc.contributor.orcidimecCouet, Sebastien::0000-0001-6436-9593
dc.contributor.orcidimecMertens, Sofie::0000-0002-1482-6730
dc.contributor.orcidimecSouriau, Laurent::0000-0002-5138-5938
dc.contributor.orcidimecYasin, Farrukh::0000-0002-7295-0254
dc.contributor.orcidimecFurnemont, Arnaud::0000-0002-6378-1030
dc.source.peerreviewno
dc.source.conferenceInternational Electron Devices Meeting - IEDM
dc.source.conferencedate4/12/2016
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - imec


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