dc.contributor.author | Kruger, O. | |
dc.contributor.author | Seifert, W. | |
dc.contributor.author | Kittler, M. | |
dc.contributor.author | Gutjahr, A. | |
dc.contributor.author | Silier, I. | |
dc.contributor.author | Konuma, M. | |
dc.contributor.author | Said, Khalid | |
dc.contributor.author | Caymax, Matty | |
dc.contributor.author | Poortmans, Jef | |
dc.date.accessioned | 2021-09-30T12:24:40Z | |
dc.date.available | 2021-09-30T12:24:40Z | |
dc.date.issued | 1998 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2683 | |
dc.source | IIOimport | |
dc.title | Electrical properties of SiGe layers grown by LPE and CVD | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Caymax, Matty | |
dc.contributor.imecauthor | Poortmans, Jef | |
dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 185 | |
dc.source.endpage | 189 | |
dc.source.conference | Proceedings of the 10th Conference on Semiconducting and Insluating Materials - SIMC-X | |
dc.source.conferencedate | 1/06/1998 | |
dc.source.conferencelocation | Berkeley, CA USA | |
imec.availability | Published - open access | |