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Aanlysing the composition of doped diamond at the atomic level using atom probe tomography

dc.contributor.authorMartin, T.L.
dc.contributor.authorDrijkoningen, Sien
dc.contributor.authorOthman, M.Z.
dc.contributor.authorBagot, P.A.J.
dc.contributor.authorKoelling, S.
dc.contributor.authorMay, P.W.
dc.contributor.authorHaenen, Ken
dc.contributor.authorMoody, P.
dc.date.accessioned2021-10-23T12:35:54Z
dc.date.available2021-10-23T12:35:54Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26972
dc.sourceIIOimport
dc.titleAanlysing the composition of doped diamond at the atomic level using atom probe tomography
dc.typeOral presentation
dc.contributor.imecauthorHaenen, Ken
dc.contributor.orcidimecHaenen, Ken::0000-0001-6711-7367
dc.source.peerreviewno
dc.source.conferenceHasselt Diamond Workshop - SBDD XXI
dc.source.conferencedate9/03/2016
dc.source.conferencelocationHasselt Belgium
imec.availabilityPublished - imec


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