Reliability and parasitic issues in GaN-based power HEMTs

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Authors

Meneghesso, Gaudenzio; Meneghini, Matteo; Rossetto, Isabella; Bisi, Davide; Stoffels, Steve; Van Hove, Marleen; Decoutere, Stefaan; Zanoni, Enrico

ISSN

0268-1242

Issue

9

Journal

Semiconductor Science and Technology

Volume

31

Title

Reliability and parasitic issues in GaN-based power HEMTs

Publication type

Journal article

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