Normally-off HEMTs with p-GaN gate: stability and lifetime extrapolation

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Authors
Meneghesso, Gaudenzio; Meneghini, Matteo; Rossetto, Isabella; Rizzato, Vanessa; Stoffels, Steve; Van Hove, Marleen; Wu, Tian-Li; You, Shuzhen; Posthuma, Niels; Decoutere, Stefaan; Zanoni, Enrico
Conference
International Workshop on Nitride Semiconductors (IWN)
Title
Normally-off HEMTs with p-GaN gate: stability and lifetime extrapolation
Publication type
Proceedings paper
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