dc.contributor.author | Murota, Junichi | |
dc.contributor.author | Yamamoto, Yuchi | |
dc.contributor.author | Costina, Ioan | |
dc.contributor.author | Tillack, Bernd | |
dc.contributor.author | Le Thanh, Vin | |
dc.contributor.author | Loo, Roger | |
dc.contributor.author | Caymax, Matty | |
dc.date.accessioned | 2021-10-23T13:08:52Z | |
dc.date.available | 2021-10-23T13:08:52Z | |
dc.date.issued | 2016 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/27059 | |
dc.source | IIOimport | |
dc.title | Atomically controlled processing for Si and Ge CVD epitaxial growth | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Loo, Roger | |
dc.contributor.imecauthor | Caymax, Matty | |
dc.contributor.orcidimec | Loo, Roger::0000-0003-3513-6058 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 71 | |
dc.source.endpage | 82 | |
dc.source.conference | Dielectrics for Nanosystems 7: Materials Science, Processing, Reliability, and Manufacturing | |
dc.source.conferencedate | 29/05/2016 | |
dc.source.conferencelocation | San Dego, CA usa | |
dc.identifier.url | http://ecst.ecsdl.org/content/72/2/71.abstract | |
imec.availability | Published - open access | |
imec.internalnotes | ECS Transactions; Vol. 72, Issue 2 | |