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Static and low frequency noise characterization of n-channel 16nm UTBOX devices

dc.contributor.authorNafaa, B.
dc.contributor.authorIsmail, N.
dc.contributor.authorTouayar, O.
dc.contributor.authorCretu, B.
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-23T13:11:05Z
dc.date.available2021-10-23T13:11:05Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27065
dc.sourceIIOimport
dc.titleStatic and low frequency noise characterization of n-channel 16nm UTBOX devices
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage14
dc.source.endpage18
dc.source.conference7th International Conference on Sciences of Electronics, Technologies of Information and Telecommunications - SETIT
dc.source.conferencedate18/12/2016
dc.source.conferencelocationHammamet Tunisia
imec.availabilityPublished - open access


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