dc.contributor.author | Popovici, Mihaela Ioana | |
dc.contributor.author | Redolfi, Augusto | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Hody, Hubert | |
dc.contributor.author | Jurczak, Gosia | |
dc.contributor.author | Van Elshocht, Sven | |
dc.date.accessioned | 2021-10-23T13:51:05Z | |
dc.date.available | 2021-10-23T13:51:05Z | |
dc.date.issued | 2016 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/27164 | |
dc.source | IIOimport | |
dc.title | Investigation of physical and electrical scaling limits of strontium titanate in metal-insulator-metal capacitors for DRAM technology | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Popovici, Mihaela Ioana | |
dc.contributor.imecauthor | Redolfi, Augusto | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | Hody, Hubert | |
dc.contributor.imecauthor | Jurczak, Gosia | |
dc.contributor.imecauthor | Van Elshocht, Sven | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | Van Elshocht, Sven::0000-0002-6512-1909 | |
dc.contributor.orcidimec | Popovici, Mihaela Ioana::0000-0002-9838-1088 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 131 | |
dc.source.endpage | 132 | |
dc.source.conference | 19th Workshop on Dielectrics in Microelectronics - WODIM | |
dc.source.conferencedate | 27/06/2016 | |
dc.source.conferencelocation | Catania Italia | |
imec.availability | Published - imec | |
imec.internalnotes | Abstract only | |