dc.contributor.author | Raghavan, Praveen | |
dc.contributor.author | Garcia Bardon, Marie | |
dc.contributor.author | Schuddinck, Pieter | |
dc.contributor.author | Jang, Doyoung | |
dc.contributor.author | Yakimets, Dmitry | |
dc.contributor.author | Baert, Rogier | |
dc.contributor.author | Debacker, Peter | |
dc.contributor.author | Verkest, Diederik | |
dc.contributor.author | Thean, Aaron | |
dc.date.accessioned | 2021-10-23T13:57:57Z | |
dc.date.available | 2021-10-23T13:57:57Z | |
dc.date.issued | 2016 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/27180 | |
dc.source | IIOimport | |
dc.title | 5nm: has the time for a device change come? | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Garcia Bardon, Marie | |
dc.contributor.imecauthor | Schuddinck, Pieter | |
dc.contributor.imecauthor | Jang, Doyoung | |
dc.contributor.imecauthor | Yakimets, Dmitry | |
dc.contributor.imecauthor | Baert, Rogier | |
dc.contributor.imecauthor | Debacker, Peter | |
dc.contributor.imecauthor | Verkest, Diederik | |
dc.contributor.imecauthor | Thean, Aaron | |
dc.contributor.orcidimec | Debacker, Peter::0000-0003-3825-5554 | |
dc.contributor.orcidimec | Verkest, Diederik::0000-0001-6567-2746 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 275 | |
dc.source.endpage | 277 | |
dc.source.conference | 17th International Symposium on Quality Electronic Design - ISQED | |
dc.source.conferencedate | 15/03/2016 | |
dc.source.conferencelocation | Santa Clara, CA USA | |
dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7479213 | |
imec.availability | Published - open access | |