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5nm: has the time for a device change come?

dc.contributor.authorRaghavan, Praveen
dc.contributor.authorGarcia Bardon, Marie
dc.contributor.authorSchuddinck, Pieter
dc.contributor.authorJang, Doyoung
dc.contributor.authorYakimets, Dmitry
dc.contributor.authorBaert, Rogier
dc.contributor.authorDebacker, Peter
dc.contributor.authorVerkest, Diederik
dc.contributor.authorThean, Aaron
dc.date.accessioned2021-10-23T13:57:57Z
dc.date.available2021-10-23T13:57:57Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27180
dc.sourceIIOimport
dc.title5nm: has the time for a device change come?
dc.typeProceedings paper
dc.contributor.imecauthorGarcia Bardon, Marie
dc.contributor.imecauthorSchuddinck, Pieter
dc.contributor.imecauthorJang, Doyoung
dc.contributor.imecauthorYakimets, Dmitry
dc.contributor.imecauthorBaert, Rogier
dc.contributor.imecauthorDebacker, Peter
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecDebacker, Peter::0000-0003-3825-5554
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage275
dc.source.endpage277
dc.source.conference17th International Symposium on Quality Electronic Design - ISQED
dc.source.conferencedate15/03/2016
dc.source.conferencelocationSanta Clara, CA USA
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7479213
imec.availabilityPublished - open access


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