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Analysis of carrier mobility in triple gate SOI nFinFET combining rotated substrate and strain
Publication:
Analysis of carrier mobility in triple gate SOI nFinFET combining rotated substrate and strain
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Date
2016
Proceedings Paper
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33891.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ribeiro, Thales
;
Simoen, Eddy
;
Claeys, Cor
;
Martino, Joao A.
;
Pavanello, Marcello
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1864
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Acq. date: 2025-12-12
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Metrics
Views
1864
since deposited on 2021-10-23
1
last month
Acq. date: 2025-12-12
Citations