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Approximating standard cell delay distributions by reformulating the most probable failure point

dc.contributor.authorRodopoulos, Dimitrios
dc.contributor.authorRoussel, Philippe
dc.contributor.authorCatthoor, Francky
dc.contributor.authorSazeides, Yiannakis
dc.contributor.authorSoudris, Dimitrios
dc.date.accessioned2021-10-23T14:17:50Z
dc.date.available2021-10-23T14:17:50Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27226
dc.sourceIIOimport
dc.titleApproximating standard cell delay distributions by reformulating the most probable failure point
dc.typeProceedings paper
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.source.peerreviewyes
dc.source.conferenceWorkshop on Early Reliability Modeling for Aging and Variability in Silicon Systems at DATE
dc.source.conferencedate14/03/2016
dc.source.conferencelocationDresden Germany
imec.availabilityPublished - imec


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