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Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices

dc.contributor.authorSimoen, Eddy
dc.contributor.authorCretu, Bogdan
dc.contributor.authorFang, Wen
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorRoutoure, Jean-Marc
dc.contributor.authorCarin, Regis
dc.contributor.authorLuo, Jun
dc.contributor.authorZhao, Chao
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-23T14:55:17Z
dc.date.available2021-10-23T14:55:17Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27312
dc.sourceIIOimport
dc.titleLow-frequency noise spectroscopy of bulk and border traps in nanoscale devices
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.source.peerreviewyes
dc.source.beginpage449
dc.source.endpage458
dc.source.conference16th Gettering and Defect Engineering in Semiconductors Conference - GADEST XVI
dc.source.conferencedate20/09/2015
dc.source.conferencelocationBad Staffelstein Germany
dc.identifier.urlhttp://www.scientific.net/SSP.242.449
imec.availabilityPublished - imec
imec.internalnotesSolid State Phenomena; Vol. 242


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