Publication:

Study of electrically active defects in epitaxial layers on silicon

Date

2016

Proceedings Paper

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Author(s)

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Dhayalan, Sathish Kumar

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Jayachandran, Suseendran

;

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Gencarelli, Federica

;

Hikavyy, Andriy

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;

;

Delabie, Annelies

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;

;

;

Vrielinck, Henk

;

Lauwaert, Johan

Metrics

1931 since deposited on 2021-10-23

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Acq. date: 2026-01-08