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Generation-recombination noise in advanced CMOS devices

dc.contributor.authorSimoen, Eddy
dc.contributor.authorOliveira, Alberto
dc.contributor.authorBoudier, Dimitri
dc.contributor.authorMitard, Jerome
dc.contributor.authorWitters, Liesbeth
dc.contributor.authorVeloso, Anabela
dc.contributor.authorAgopian, Paula
dc.contributor.authorMartino, Joao
dc.contributor.authorCarin, Regis
dc.contributor.authorLanger, Robert
dc.contributor.authorCollaert, Nadine
dc.contributor.authorThean, Aaron
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-23T14:59:06Z
dc.date.available2021-10-23T14:59:06Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27320
dc.sourceIIOimport
dc.titleGeneration-recombination noise in advanced CMOS devices
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorWitters, Liesbeth
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorLanger, Robert
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecLanger, Robert::0000-0002-1132-3468
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewyes
dc.source.beginpage111
dc.source.endpage120
dc.source.conference14th Symposium on High Purity and High Mobility Semiconductors
dc.source.conferencedate2/10/2016
dc.source.conferencelocationPennington USA
dc.identifier.urlhttp://ecst.ecsdl.org/content/75/5/111
imec.availabilityPublished - imec
imec.internalnotesECS Transactions; Vol. 75, Issue 5


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