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Capturing true workload dependency of BTI-induced degradation in CPU components

dc.contributor.authorStamoulis, Dimitrios
dc.contributor.authorCorbetta, Simone
dc.contributor.authorRodopoulos, Dimitrios
dc.contributor.authorWeckx, Pieter
dc.contributor.authorDebacker, Peter
dc.contributor.authorMeyer H., Brett
dc.contributor.authorKaczer, Ben
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorSoudris, Dimitrios
dc.contributor.authorCatthoor, Francky
dc.contributor.authorZilic, Zeljko
dc.date.accessioned2021-10-23T15:12:32Z
dc.date.available2021-10-23T15:12:32Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27348
dc.sourceIIOimport
dc.titleCapturing true workload dependency of BTI-induced degradation in CPU components
dc.typeProceedings paper
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorDebacker, Peter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecDebacker, Peter::0000-0003-3825-5554
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage373
dc.source.endpage376
dc.source.conferenceProceedings of the 26th Great Lakes Symposium on VLSI - GLSVLSI
dc.source.conferencedate18/05/2016
dc.source.conferencelocationBoston, MA USA
dc.identifier.urlhttp://dl.acm.org/citation.cfm?doid=2902961.2902992
imec.availabilityPublished - open access


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