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In depth analysis of post-program VT instability after electrical stress in 3D SONOS memories

dc.contributor.authorSubirats, Alexandre
dc.contributor.authorArreghini, Antonio
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorDegraeve, Robin
dc.contributor.authorLinten, Dimitri
dc.contributor.authorFurnemont, Arnaud
dc.date.accessioned2021-10-23T15:18:11Z
dc.date.available2021-10-23T15:18:11Z
dc.date.issued2016-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27360
dc.sourceIIOimport
dc.titleIn depth analysis of post-program VT instability after electrical stress in 3D SONOS memories
dc.typeProceedings paper
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorFurnemont, Arnaud
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecFurnemont, Arnaud::0000-0002-6378-1030
dc.source.peerreviewyes
dc.source.beginpage84
dc.source.endpage87
dc.source.conferenceInternational Memory Workshop - IMW
dc.source.conferencedate15/05/2016
dc.source.conferencelocationParis France
imec.availabilityPublished - imec


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