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Influence of the film morphology and orientation on the depth profiling of perovskite layers

dc.contributor.authorSurana, Supriya
dc.contributor.authorBastos, Joao
dc.contributor.authorQiu, Weiming
dc.contributor.authorConard, Thierry
dc.contributor.authorPoleunis, Claude
dc.contributor.authorDelcorte, Arnaud
dc.contributor.authorVandervorst, Wilfried
dc.date.accessioned2021-10-23T15:21:58Z
dc.date.available2021-10-23T15:21:58Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27368
dc.sourceIIOimport
dc.titleInfluence of the film morphology and orientation on the depth profiling of perovskite layers
dc.typeOral presentation
dc.contributor.imecauthorBastos, Joao
dc.contributor.imecauthorQiu, Weiming
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorVandervorst, Wilfried
dc.contributor.orcidimecBastos, Joao::0000-0002-8877-9850
dc.contributor.orcidimecQiu, Weiming::0000-0002-9672-7225
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.source.peerreviewno
dc.source.conferenceSIMS Europe
dc.source.conferencedate18/06/2016
dc.source.conferencelocationMünster Germany
imec.availabilityPublished - imec


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